Microscope stand
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Description
FIG. 1 is a perspective view of a microscope stand showing our new design;
FIG. 2 is a left side elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a bottom plan view thereof; and,
FIG. 7 is a top plan view thereof.
The broken lines in FIGS. 1,2,3,4,5, and 7 is for illustrative purposes only and forms no part of the claimed design.
Referenced Cited
Patent History
Patent number: D425921
Type: Grant
Filed: Jun 29, 1999
Date of Patent: May 30, 2000
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Werner Holbl (Vienna), Scott W. Parks (Clarence, NY)
Primary Examiner: Paula A. Mortimer
Law Firm: Simpson, Simpson & Snyder
Application Number: 0/107,199
Type: Grant
Filed: Jun 29, 1999
Date of Patent: May 30, 2000
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Werner Holbl (Vienna), Scott W. Parks (Clarence, NY)
Primary Examiner: Paula A. Mortimer
Law Firm: Simpson, Simpson & Snyder
Application Number: 0/107,199
Classifications