Microscope stand

- Leica Microsystems Inc.
Description

FIG. 1 is a perspective view of a microscope stand showing our new design;

FIG. 2 is a left side elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a top plan view thereof.

The broken lines in FIGS. 1,2,3,4,5, and 7 is for illustrative purposes only and forms no part of the claimed design.

Referenced Cited
U.S. Patent Documents
D260402 August 25, 1981 Hodgson
D291702 September 1, 1987 Kahute
D345748 April 5, 1994 Holbl
D389163 January 13, 1998 Hofmann-Igl
D400548 November 3, 1998 Komatsuzaki
Patent History
Patent number: D425921
Type: Grant
Filed: Jun 29, 1999
Date of Patent: May 30, 2000
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Werner Holbl (Vienna), Scott W. Parks (Clarence, NY)
Primary Examiner: Paula A. Mortimer
Law Firm: Simpson, Simpson & Snyder
Application Number: 0/107,199
Classifications
Current U.S. Class: Microscope (D16/131)
International Classification: 1606;