Refractometer
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Description
FIG. 1 is a front perspective view of a refractometer showing our new design;
FIG. 2 is a rear perspective view thereof;
FIG. 3 is a left side elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a front elevational view thereof;
FIG. 6 is a rear elevational view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is a top plan view thereof.
Patent History
Patent number: D427530
Type: Grant
Filed: Oct 27, 1999
Date of Patent: Jul 4, 2000
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Jeffrey R. Maines (Lancaster, NY), Erin D. Spring (Corfu, NY)
Primary Examiner: Antoine Duval Davis
Law Firm: Simpson, Simpson & Snyder, L.L.P.
Application Number: 0/112,987
Type: Grant
Filed: Oct 27, 1999
Date of Patent: Jul 4, 2000
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Jeffrey R. Maines (Lancaster, NY), Erin D. Spring (Corfu, NY)
Primary Examiner: Antoine Duval Davis
Law Firm: Simpson, Simpson & Snyder, L.L.P.
Application Number: 0/112,987
Classifications
Current U.S. Class:
Measuring, Regulating Or Indicating Instrument, Or Casing (D10/46)
International Classification: 1004;
International Classification: 1004;