Microscope stand

- Leica Microsystems Inc.
Skip to: Description  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a microscope stand showing our new design;

FIG. 2 is a left side elevational view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a top plan view thereof.

In the figures the broken lines are for illustrative purposes only and forms no part of the claimed design.

Referenced Cited
U.S. Patent Documents
D296904 July 26, 1988 Lukaszewski
D345746 April 5, 1994 Holbl
D345748 April 5, 1994 Holbl
D354761 January 24, 1995 Komatsuzaki et al.
D389163 January 13, 1998 Hofmann-Igl
D400548 November 3, 1998 Komatsuzaki
Patent History
Patent number: D429265
Type: Grant
Filed: Sep 22, 1999
Date of Patent: Aug 8, 2000
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventors: Werner Holbl (Vienna), Scott W. Parks (E. Amherst, NY)
Primary Examiner: Paula A. Mortimer
Law Firm: Simpson, Simpson & Snyder, L.L.P.
Application Number: 0/111,186
Classifications
Current U.S. Class: Microscope (D16/131)
International Classification: 1606;