Metrological instrument
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FIG. 1 is a top, front and left side perspective view of metrological instrument showing my new design;
FIG. 2 is a left side perspective view thereof;
FIG. 3 is a bottom, rear and left side perspective view thereof;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a top, front and left side perspective view of a second embodiment of metrological instrument showing the parts thereof when separated;
FIG. 7 is a left side perspective view thereof;
FIG. 8 is a front elevational view thereof;
FIG. 9 is a rear elevational view thereof;
FIG. 10 is a bottom, rear and left side perspective view of a third embodiment of metrological instrument;
FIG. 11 is a bottom, front and right side perspective view thereof showing the parts thereof separated;
FIG. 12 is a top, front and right side perspective view thereof;
FIG. 13 is a front elevational view thereof, the rear view being a mirror image of the front view shown;
FIG. 14 is a right side view thereof, the left side view being a mirror image of the side view shown;
FIG. 15 is a top, front and right side perspective of a fourth embodiment of metrological instrument;
FIG. 16 is a left side elevational view thereof, the right side elevational view being a mirror image of the side view shown;
FIG. 17 is a front elevational view thereof; and,
FIG. 18 is a rear elevational view thereof.
The phantom line showing in the drawings is for illustrative purposes only and forms no part of the claimed design.
The bottom part has not been shown for ease of illustration in figure drawings 15-18.
Claims
The ornamental design for a metrological instrument, as shown and described.
5929326 | July 27, 1999 | Imaino et al. |
Type: Grant
Filed: Nov 10, 1999
Date of Patent: Apr 3, 2001
Assignee: Taylor Hobson Limited (Leicester)
Inventor: David Graham Bell (Leicester)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
Application Number: 29/113,673