Electrical test probe
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FIG. 1 is a perspective view of the electrical test probe of this invention showing a detachable primary probe point detached to reveal a non-detachable secondary sharp probe point;
FIG. 2 is a top view thereof with the secondary probe point covered;
FIG. 3 is a top view thereof to clearly illustrate the location of views shown in FIGS. 8, 9 and 10;
FIG. 4 is a front view thereof with the secondary probe point covered, the back view being a mirror image of the front view;
FIG. 5 is a bottom view thereof with the secondary probe point covered;
FIG. 6 is a left side view thereof;
FIG. 7 is a right side view thereof;
FIG. 8 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 8—8;
FIG. 9 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 9—9; and,
FIG. 10 is a view of the exterior surfaces only of what would be seen were the probe cut and viewed along the line 10—10.
Claims
The ornamental design for an electrical test probe, as shown and described.
Type: Grant
Filed: Apr 6, 2000
Date of Patent: May 1, 2001
Assignee: Hickok, Incorporated (Cleveland, OH)
Inventor: Thomas F. Bauman (Westlake, OH)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Donald A. Bergquist
Application Number: 29/121,319