Microwave probe

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Description

FIG. 1 is a front, left side top perspective of a microwave probe showing my new design;

FIG. 2 is a rear perspective view thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a top view thereof;

FIG. 5 is a right end view thereof;

FIG. 6 is a bottom view thereof;

FIG. 7 is a front view thereof; and,

FIG. 8 is a rear view thereof.

Claims

The ornamental design for a microwave probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D423377 April 25, 2000 Atterbury et al.
5190054 March 2, 1993 Fetter et al.
5531662 July 2, 1996 Carr
6026331 February 15, 2000 Feldberg et al.
Patent History
Patent number: D443837
Type: Grant
Filed: Aug 25, 2000
Date of Patent: Jun 19, 2001
Assignee: BTG Källe Inventing AB
Inventors: Niklas Elvin (Grums), Joakim Kullander (Säffle)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Ostrolenk, Faber, Gerb & Soffen, LLP
Application Number: 29/128,587
Classifications
Current U.S. Class: Radiation, E.g., Geiger Counter (D10/47); 10/78
International Classification: 1004;