Automatic refractometer

- Leica Microsystems Inc.
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Description

FIG. 1 is a front perspective view of an automatic refractometer showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a bottom plan view thereof;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a left-side elevational view thereof; and,

FIG. 7 is a right-side elevational view thereof.

Claims

The ornamental design for an automatic refractometer, as shown.

Referenced Cited
U.S. Patent Documents
D285485 September 2, 1986 Kahute
4640616 February 3, 1987 Michalik
4692024 September 8, 1987 Bloss
D296004 May 31, 1988 Kahute
D316144 April 9, 1991 Nishimura
D327024 June 16, 1992 Elie
D341541 November 23, 1993 Ichiyoshi
6172746 January 9, 2001 Byrne et al.
Patent History
Patent number: D457962
Type: Grant
Filed: Nov 8, 2001
Date of Patent: May 28, 2002
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventor: Werner Hoelbl (Vienna)
Primary Examiner: Stella Reid
Attorney, Agent or Law Firm: Simpson & Simpson, PLLC
Application Number: 29/151,498
Classifications
Current U.S. Class: Ophthalmic (44) (D24/172)
International Classification: 2401;