Automatic refractometer
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Description
FIG. 1 is a front perspective view of an automatic refractometer showing my new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a front elevational view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a left-side elevational view thereof; and,
FIG. 7 is a right-side elevational view thereof.
Claims
The ornamental design for an automatic refractometer, as shown.
Referenced Cited
Patent History
Patent number: D457962
Type: Grant
Filed: Nov 8, 2001
Date of Patent: May 28, 2002
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventor: Werner Hoelbl (Vienna)
Primary Examiner: Stella Reid
Attorney, Agent or Law Firm: Simpson & Simpson, PLLC
Application Number: 29/151,498
Type: Grant
Filed: Nov 8, 2001
Date of Patent: May 28, 2002
Assignee: Leica Microsystems Inc. (Depew, NY)
Inventor: Werner Hoelbl (Vienna)
Primary Examiner: Stella Reid
Attorney, Agent or Law Firm: Simpson & Simpson, PLLC
Application Number: 29/151,498
Classifications