Electrical test instrument

- Fluke Corporation
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Description

FIG. 1 is a perspective view of a first embodiment of an electrical test instrument showing our new design;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a right side elevation view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a left side elevation view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

Claims

The ornamental design for an electrical test instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D399150 October 6, 1998 Fisher
D401172 November 17, 1998 Kuramoto
D440892 April 24, 2001 Kuramoto
D450002 November 6, 2001 Chang
D452659 January 1, 2002 Harju et al.
Patent History
Patent number: D467190
Type: Grant
Filed: May 14, 2001
Date of Patent: Dec 17, 2002
Assignee: Fluke Corporation (Everett, WA)
Inventors: John K. Ikeda (Seattle, WA), Duncan N. Kearsley (Stanwood, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/141,875
Classifications
Current U.S. Class: Clamp-around Type (D10/79)
International Classification: 1004;