Electrical test instrument
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Description
FIG. 1 is a perspective view of a first embodiment of an electrical test instrument showing our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
Claims
The ornamental design for an electrical test instrument, as shown and described.
Referenced Cited
Patent History
Patent number: D467190
Type: Grant
Filed: May 14, 2001
Date of Patent: Dec 17, 2002
Assignee: Fluke Corporation (Everett, WA)
Inventors: John K. Ikeda (Seattle, WA), Duncan N. Kearsley (Stanwood, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/141,875
Type: Grant
Filed: May 14, 2001
Date of Patent: Dec 17, 2002
Assignee: Fluke Corporation (Everett, WA)
Inventors: John K. Ikeda (Seattle, WA), Duncan N. Kearsley (Stanwood, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/141,875
Classifications
