Electrical probe

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Description

FIG. 1 is a perspective view of the electrical probe according to my design;

FIG. 2 is a right side elevational view of the electrical probe;

FIG. 3 is a top plan view of the electrical probe;

FIG. 4 is a left side elevational view of the electrical probe;

FIG. 5 is a bottom plan view of the electrical probe;

FIG. 6 is a front elevational view of the electrical probe; and,

FIG. 7 is a rear elevational view of the electrical probe.

Claims

The ornamental design for an electrical probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D221153 July 1971 Shimasaki
D243717 March 15, 1977 Edmark et al.
D263380 March 16, 1982 Hay
D299318 January 10, 1989 Chiang
5103165 April 7, 1992 Sirattz
D351562 October 18, 1994 Moffatt et al.
5363045 November 8, 1994 Martin et al.
D371747 July 16, 1996 Strader
D383988 September 23, 1997 Luebke
5877618 March 2, 1999 Luebke et al.
D410203 May 25, 1999 Beha
D425803 May 30, 2000 Luebke et al.
6242903 June 5, 2001 Klingberg et al.
6259243 July 10, 2001 Lundquist
6377054 April 23, 2002 Beha
6424139 July 23, 2002 Bystrom et al.
6510918 January 28, 2003 Bates
Foreign Patent Documents
09166621 June 1997 JP
Patent History
Patent number: D500799
Type: Grant
Filed: Jul 16, 2003
Date of Patent: Jan 11, 2005
Assignee: Greenlee Textron Inc. (Rockford, IL)
Inventor: Geoffrey Olson (Round Lake, IL)
Primary Examiner: Antoine D. Davis
Attorney: Trexler, Bushnell, Giangiorgi, Blackstone & Marr, Ltd.
Application Number: 29/186,476
Classifications
Current U.S. Class: Simulative (D19/80)