Temperature probe handle
Description
FIG. 1 is a perspective view of a temperature probe handle showing my new design;
FIG. 2 is a front plan view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a left side elevation view thereof;
FIG. 5 is a rear plan view thereof;
FIG. 6 is a top elevation view thereof; and,
FIG. 7 is a bottom elevation view thereof.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
Claims
The ornamental design for a temperature probe handle, as shown and described.
Referenced Cited
Patent History
Patent number: D512924
Type: Grant
Filed: Jun 28, 2004
Date of Patent: Dec 20, 2005
Inventor: John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine D. Davis
Application Number: 29/208,387
Type: Grant
Filed: Jun 28, 2004
Date of Patent: Dec 20, 2005
Inventor: John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine D. Davis
Application Number: 29/208,387
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/60)