Temperature probe handle

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a perspective view of a temperature probe handle showing my new design;

FIG. 2 is a front plan view thereof;

FIG. 3 is a right side elevation view thereof;

FIG. 4 is a left side elevation view thereof;

FIG. 5 is a rear plan view thereof;

FIG. 6 is a top elevation view thereof; and,

FIG. 7 is a bottom elevation view thereof.

The broken line showing is for illustrative purposes only and forms no part of the claimed design.

Claims

The ornamental design for a temperature probe handle, as shown and described.

Referenced Cited
U.S. Patent Documents
D249126 August 29, 1978 Pitstick et al.
D260084 August 4, 1981 Asano
D384730 October 7, 1997 Doughty et al.
6695782 February 24, 2004 Ranucci et al.
Patent History
Patent number: D512924
Type: Grant
Filed: Jun 28, 2004
Date of Patent: Dec 20, 2005
Inventor: John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine D. Davis
Application Number: 29/208,387
Classifications