Electrical test instrument
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Description
The broken lines showing instrument controls, display panel and i/o ports in the figures are for illustrative purposes only and form no part of the claimed design.
Claims
The ornamental design for an electrical test instrument, as shown and described.
Referenced Cited
Patent History
Patent number: D545703
Type: Grant
Filed: May 7, 2003
Date of Patent: Jul 3, 2007
Assignee: Fluke Corporation (Everett, WA)
Inventor: John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine D. Davis
Attorney: Richard A. Koske
Application Number: 29/181,322
Type: Grant
Filed: May 7, 2003
Date of Patent: Jul 3, 2007
Assignee: Fluke Corporation (Everett, WA)
Inventor: John K. Ikeda (Seattle, WA)
Primary Examiner: Antoine D. Davis
Attorney: Richard A. Koske
Application Number: 29/181,322
Classifications