Joint condition-checking fastener for connectors
Latest Omron Corporation Patents:
- Component inspection device
- Drive control apparatus for composite resonance circuit including a plurality of resonance circuits
- Detection device, control method for detection device, method for generating model by model generation device that generates trained model, and recording medium
- Push button switch
- Agent control device, learning device, and computer-readable recording medium
Description
The broken lines are for illustrative purposes only and form no part of the claimed design.
Claims
The ornamental design for a joint condition-checking fastener for connectors, as shown and described.
Referenced Cited
U.S. Patent Documents
| 2720633 | October 1955 | Westberg |
| 3999828 | December 28, 1976 | Howell |
| D242986 | January 11, 1977 | Inglis |
| 4183603 | January 15, 1980 | Donarummo |
| 4221449 | September 9, 1980 | Shugart, Jr. |
| D310775 | September 25, 1990 | Ruonala |
| D340695 | October 26, 1993 | Merriman et al. |
| D381890 | August 5, 1997 | Levy |
| 5685732 | November 11, 1997 | Lane |
| D456361 | April 30, 2002 | Troxell |
| D466088 | November 26, 2002 | Saben |
| D479509 | September 9, 2003 | Cocchiola, Jr. |
| D491055 | June 8, 2004 | Chou |
| D491535 | June 15, 2004 | Chien |
Patent History
Patent number: D549086
Type: Grant
Filed: Nov 21, 2006
Date of Patent: Aug 21, 2007
Assignee: Omron Corporation (Kyoto)
Inventors: Taijiro Fujiwara (Okayama-ken), Takeshi Misen (Okayama-ken)
Primary Examiner: Holly H. Baynham
Assistant Examiner: Cynthia M. Chin
Attorney: Dickstein Shapiro LLP
Application Number: 29/269,109
Type: Grant
Filed: Nov 21, 2006
Date of Patent: Aug 21, 2007
Assignee: Omron Corporation (Kyoto)
Inventors: Taijiro Fujiwara (Okayama-ken), Takeshi Misen (Okayama-ken)
Primary Examiner: Holly H. Baynham
Assistant Examiner: Cynthia M. Chin
Attorney: Dickstein Shapiro LLP
Application Number: 29/269,109
Classifications
Current U.S. Class:
D8/382