Electrical test instrument body
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Description
The details shown in broken lines are included for illustrative purposes only and form no part of the claimed design.
Claims
I claim the ornamental design for an electrical test instrument body, as shown and described.
Referenced Cited
Patent History
Patent number: D559715
Type: Grant
Filed: Apr 27, 2006
Date of Patent: Jan 15, 2008
Assignee: Fluke Corporation (Everett, WA)
Inventors: B. Matthew Marzynski (Seattle, WA), Tim Richter (Shanghai)
Primary Examiner: Antoine D. Davis
Attorney: Dorsey & Whitney LLP
Application Number: 29/258,975
Type: Grant
Filed: Apr 27, 2006
Date of Patent: Jan 15, 2008
Assignee: Fluke Corporation (Everett, WA)
Inventors: B. Matthew Marzynski (Seattle, WA), Tim Richter (Shanghai)
Primary Examiner: Antoine D. Davis
Attorney: Dorsey & Whitney LLP
Application Number: 29/258,975
Classifications
Current U.S. Class:
Clamp-around Type (D10/79)