Diagnostic instrument

- NIR Diagnostics Inc.
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Description

FIG. 1 is a perspective view of the diagnostic instrument;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom elevational view thereof.

Claims

The ornamental design for a diagnostic instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D397046 August 18, 1998 Oshizawa
Patent History
Patent number: D564924
Type: Grant
Filed: Jan 5, 2007
Date of Patent: Mar 25, 2008
Assignee: NIR Diagnostics Inc. (Campbellville, Ontario)
Inventors: Ashwani Kaushal (Mississauga), Duncan MacIntyre (Campbellville)
Primary Examiner: Antoine D. Davis
Attorney: Hovey Williams LLP
Application Number: 29/275,785