Apparatus for measuring electrical parameters

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a top perspective view of the measuring apparatus;

FIG. 2 is a lower perspective view of the apparatus of FIG. 1;

FIG. 3 is a top plan view of the apparatus of FIGS. 1 and 2;

FIG. 4 is an end view of the apparatus as depicted in FIG. 3;

FIG. 5 is a left plan view of the apparatus shown in FIG. 3;

FIG. 6 is a right plan view of the apparatus shown in FIG. 3;

FIG. 7 is an end view of the apparatus shown in FIG. 3; and,

FIG. 8 is a lower plan view of the device shown in FIG. 2.

Claims

The ornamental design for a apparatus for measuring electrical parameters, as shown and described.

Referenced Cited
U.S. Patent Documents
5227984 July 13, 1993 Meldrum et al.
D469026 January 21, 2003 Hoofnagle et al.
D541685 May 1, 2007 Bradford
7332923 February 19, 2008 Schott et al.
Patent History
Patent number: D575174
Type: Grant
Filed: Jul 6, 2007
Date of Patent: Aug 19, 2008
Assignee: Liaisons Electroniques-Mecaniques Lem SA (Plan-Les-Ouates)
Inventor: Pascal Morel (Saint Pierre en Faucigny)
Primary Examiner: Antoine D Davis
Attorney: Baker & Daniels LLP
Application Number: 29/289,116
Classifications