Film thickness meter

- Kett Electric Laboratory
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Description

FIG. 1 is a front elevational view.

FIG. 2 is a rear elevational view.

FIG. 3 is a right side elevational view.

FIG. 4 is a left side elevational view.

FIG. 5 is a top plan view.

FIG. 6 is a bottom plan view.

FIG. 7 is a reference drawing illustrating energized state; and,

FIG. 8 is a reference drawing illustrating the state in which removable adapter is removed.

Claims

The ornamental design for a film thickness meter, as shown and described.

Referenced Cited
U.S. Patent Documents
1494648 May 1924 Tillyer
2646627 July 1953 Tillyer et al.
D478019 August 5, 2003 Meyer
Patent History
Patent number: D578908
Type: Grant
Filed: Aug 17, 2007
Date of Patent: Oct 21, 2008
Assignee: Kett Electric Laboratory (Tokyo)
Inventor: Takashi Nakai (Ota-ku)
Primary Examiner: Antoine D Davis
Attorney: Wenderoth, Lind & Ponack, L.L.P.
Application Number: 29/287,533
Classifications
Current U.S. Class: Linear Or Distance (9) (D10/70)