Film thickness meter
Latest Kett Electric Laboratory Patents:
Description
Claims
The ornamental design for a film thickness meter, as shown and described.
Referenced Cited
U.S. Patent Documents
1494648 | May 1924 | Tillyer |
2646627 | July 1953 | Tillyer et al. |
D478019 | August 5, 2003 | Meyer |
Patent History
Patent number: D578908
Type: Grant
Filed: Aug 17, 2007
Date of Patent: Oct 21, 2008
Assignee: Kett Electric Laboratory (Tokyo)
Inventor: Takashi Nakai (Ota-ku)
Primary Examiner: Antoine D Davis
Attorney: Wenderoth, Lind & Ponack, L.L.P.
Application Number: 29/287,533
Type: Grant
Filed: Aug 17, 2007
Date of Patent: Oct 21, 2008
Assignee: Kett Electric Laboratory (Tokyo)
Inventor: Takashi Nakai (Ota-ku)
Primary Examiner: Antoine D Davis
Attorney: Wenderoth, Lind & Ponack, L.L.P.
Application Number: 29/287,533
Classifications
Current U.S. Class:
Linear Or Distance (9) (D10/70)