Holster for test instrument

- Fluke Corporation
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Description

FIG. 1 is a perspective view of the design for a holster for test instrument;

FIG. 2 is a front view of the design of FIG. 1;

FIG. 3 is a left side view of the design of FIG. 1, the right side view being a mirror image thereof;

FIG. 4 is a top end view of the design of FIG. 1;

FIG. 5 is a bottom end view of the design of FIG. 1; and,

FIG. 6 is a rear view of the design of FIG. 1.

Claims

We claim the ornamental design for a holster for test instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D312534 December 4, 1990 Nelson et al.
D365927 January 9, 1996 Cho
D397246 August 25, 1998 Hoofnagle et al.
5996956 December 7, 1999 Shawver
6003831 December 21, 1999 Coleman
D575056 August 19, 2008 Tan
D581151 November 25, 2008 Aipa
D597089 July 28, 2009 Khan et al.
D597301 August 4, 2009 Richardson et al.
Patent History
Patent number: D614517
Type: Grant
Filed: Aug 19, 2009
Date of Patent: Apr 27, 2010
Assignee: Fluke Corporation (Everett, WA)
Inventors: Sena E. R. Janky (Sammamish, WA), Derek Silverio (Seattle, WA)
Primary Examiner: Antoine D Davis
Attorney: patenttm.us
Application Number: 29/342,170
Classifications