Specimen collecting and testing device

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front elevational view of a specimen collecting and testing device showing my new design;

FIG. 2 is a back elevational view thereof;

FIG. 3 is a right side elevational view thereof, the left side elevational view being a mirror image thereof;

FIG. 4 is a top plan view thereof; and,

FIG. 5 is a bottom plan view thereof.

The broken lines in FIGS. 1 and 2 represent the bounds of the claim and form no part of the claimed design.

Claims

The ornamental design for a specimen collecting and testing device, as shown and described.

Referenced Cited
U.S. Patent Documents
D328136 July 21, 1992 Hayakawa
D341663 November 23, 1993 Coulter
D342575 December 21, 1993 Ashihara et al.
D369868 May 14, 1996 Nazareth et al.
D391373 February 24, 1998 Shartle
D412990 August 17, 1999 Woolston et al.
5980828 November 9, 1999 McClintock et al.
D483496 December 9, 2003 Kjendlie
D499813 December 14, 2004 Wu
D502263 February 22, 2005 Feller et al.
Patent History
Patent number: D626249
Type: Grant
Filed: Jul 21, 2009
Date of Patent: Oct 26, 2010
Assignee: Alfa Scientific Designs, Inc. (San Diego, CA)
Inventors: Naishu Wang (San Diego, CA), David F. Zhou (San Diego, CA), Wei Jin (Poway, CA)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Anhdao Doan
Attorney: Charmasson & Buchaca & Leach, LLP
Application Number: 29/340,604