Analysis instrument

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Description

FIG. 1 is a perspective view of an analysis instrument.

FIG. 2 is a front view of an analysis instrument.

FIG. 3 is a rear view of an analysis instrument.

FIG. 4 is a top plan view of an analysis instrument.

FIG. 5 is a bottom plan view of an analysis instrument.

FIG. 6 is a side view of an analysis instrument in which the left and right sides identical.

FIG. 7 is a perspective view of an analysis instrument; and,

FIG. 8 is a perspective view of an analysis instrument.

Claims

The ornamental design for an analysis instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
7603888 October 20, 2009 Zilioli
7873143 January 18, 2011 Dunham et al.
Patent History
Patent number: D649075
Type: Grant
Filed: Aug 31, 2010
Date of Patent: Nov 22, 2011
Inventors: Eric Chan (New York, NY), Shigeru Gary Natsume (New York, NY), Jeffrey Miller (New York, NY), Justin Waldinger (New York, NY), Takayoshi Hanagata (Newport News, VA)
Primary Examiner: Antoine D Davis
Attorney: Rothwell, Figg, Ernst & Manbeck, pc
Application Number: 29/368,944
Classifications
Current U.S. Class: Chemical (12) (D10/81)