Digital test device
Latest Alere Switzerland GmbH Patents:
Description
The broken lines in
Claims
The ornamental design for a digital test device, as shown and described.
Referenced Cited
U.S. Patent Documents
D373829 | September 17, 1996 | Pallender |
D412990 | August 17, 1999 | Woolston et al. |
D555802 | November 20, 2007 | Coulling et al. |
D558357 | December 25, 2007 | Byrd et al. |
D559397 | January 8, 2008 | Eriksson et al. |
D560281 | January 22, 2008 | Kozak et al. |
D562462 | February 19, 2008 | Muir et al. |
D562987 | February 26, 2008 | Colin et al. |
D574507 | August 5, 2008 | Muir et al. |
Patent History
Patent number: D659847
Type: Grant
Filed: Dec 23, 2009
Date of Patent: May 15, 2012
Assignee: Alere Switzerland GmbH (Zug)
Inventor: Wang Li (Hangzhou)
Primary Examiner: Anhdao Doan
Attorney: DLA Piper LLP (US)
Application Number: 29/352,716
Type: Grant
Filed: Dec 23, 2009
Date of Patent: May 15, 2012
Assignee: Alere Switzerland GmbH (Zug)
Inventor: Wang Li (Hangzhou)
Primary Examiner: Anhdao Doan
Attorney: DLA Piper LLP (US)
Application Number: 29/352,716
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)