Thermometry probe

- Welch Allyn, Inc.
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Description

FIG. 1 is a top perspective view of the thermometry probe according to an embodiment of the present invention;

FIG. 2 is a bottom perspective view the thermometry probe shown in FIG. 1;

FIG. 3 is a front view of the thermometry probe shown in FIG. 1;

FIG. 4 is a top view of the thermometry probe shown in FIG. 1;

FIG. 5 is a bottom view of the thermometry probe shown in FIG. 1;

FIG. 6 is a left-side view of the thermometry probe shown in FIG. 1;

FIG. 7 is a right-side view of the thermometry probe shown in FIG. 1; and,

FIG. 8 is a rear view of the thermometry probe shown in FIG. 1.

The broken lines shown herein are for illustrative purposes only and form no part of the claimed design.

Claims

The ornamental design for a thermometry probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D377317 January 14, 1997 Hartwein
D460006 July 9, 2002 Greubel et al.
D499657 December 14, 2004 Lim
D566284 April 8, 2008 Kitayama et al.
20120027047 February 2, 2012 Lane et al.
Patent History
Patent number: D660188
Type: Grant
Filed: Jan 10, 2011
Date of Patent: May 22, 2012
Assignee: Welch Allyn, Inc. (Skaneateles Falls, NY)
Inventors: Scott A. Martin (Warners, NY), John A. Lane (Weedsport, NY), Matthew D. Mullin (Memphis, NY), David E. Quinn (Auburn, NY)
Primary Examiner: Antoine D Davis
Attorney: Roger P. Bonenfant
Application Number: 29/382,907
Classifications