Calibration fixture for current probes

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Description

FIG. 1 is a perspective view of the calibration fixture for current probes.

FIG. 2 is a side elevation of the calibration fixture for current probes of FIG. 1.

FIG. 3 is a top plan view of the calibration fixture for current probes of FIG. 1.

FIG. 4 is a bottom plan view of the calibration fixture for current probes of FIG. 1.

FIG. 5 is a perspective view of the calibration fixture for current probes of FIG. 1, having the upper cover removed; and,

FIG. 6 is a sectional view of the calibration fixture for current probes of FIG. 3, taken along line 3-3.

The broken lines in FIGS. 1 and 3 depict optional connection structure and the broken lines of FIG. 6 depict unseen internal structure and are illustrative of environment and not intended to form a part of the claimed design.

Claims

The ornamental design for a calibration fixture for current probes, as shown and described.

Referenced Cited
U.S. Patent Documents
6456061 September 24, 2002 Criniti et al.
Patent History
Patent number: D662430
Type: Grant
Filed: Jul 9, 2010
Date of Patent: Jun 26, 2012
Inventor: Mark J. Hagmann (West Valley City, UT)
Primary Examiner: Antoine D Davis
Attorney: Geoffrey E. Dobbin
Application Number: 29/365,550
Classifications