Control apparatus for endoscope
Latest Hoya Corporation Patents:
- Multilayered-reflective-film-provided substrate, reflective mask blank, reflective mask, method of manufacturing reflective mask, and method of manufacturing semiconductor device
- Optical glass, optical element blank, and optical element
- Method for manufacturing annular glass substrate, annular glass substrate, and method for manufacturing glass substrate for magnetic disc
- Measuring device for an endoscope for readjusting a maximum luminosity
- REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
The broken lines immediately adjacent the shaded areas represent the bounds of the claimed design while all other broken lines are directed to environment and are for illustrative purposes only; the broken lines form no part of the claimed design.
Claims
The ornamental design for a control apparatus for endoscope, as shown and described.
| 599905 | March 1898 | Kempshall |
| D412977 | August 17, 1999 | Hayamizu |
| D481123 | October 21, 2003 | Hayamizu |
| D534654 | January 2, 2007 | Hayamizu |
| D537163 | February 20, 2007 | Nakamura |
| D550357 | September 4, 2007 | Hayamizu |
| D598098 | August 11, 2009 | Tanaka |
| D598100 | August 11, 2009 | Tanaka |
| D599905 | September 8, 2009 | Matsushita |
| 7877135 | January 25, 2011 | Iketani et al. |
| D641081 | July 5, 2011 | Onuma |
| D643117 | August 9, 2011 | Onuma |
| 20060052663 | March 9, 2006 | Koitabashi |
| 20070088193 | April 19, 2007 | Omori et al. |
| 1312707 | October 2007 | JP |
Type: Grant
Filed: Jan 6, 2012
Date of Patent: Nov 13, 2012
Assignee: Hoya Corporation (Tokyo)
Inventor: Eiji Hayamizu (Tokyo)
Primary Examiner: Bridget L Eland
Attorney: The Marbury Law Group, PLLC
Application Number: 29/410,291