Analytical instrument

- Mettler-Toledo AG
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Description

FIG. 1 is a front perspective view of a first embodiment of the analytical instrument, with broken lining on a surface showing functional elements that are not considered part of the design;

FIG. 2 is a front elevation view of the FIG. 1 device;

FIG. 3 is a top plan view of the FIG. 1 device;

FIG. 4 is a bottom plan view of the FIG. 1 device;

FIG. 5 is a left side elevation view of the FIG. 1 device;

FIG. 6 is a right side elevation view of the FIG. 1 device;

FIG. 7 is a rear elevation plan view of the FIG. 1 device, the broken lining showing operational elements that are not considered part of the design;

FIG. 8 is a front perspective view of the FIG. 1 device with a cover removed, the broken lining showing both the functional elements and the operational elements;

FIG. 9 is a front elevation view of the FIG. 8 device;

FIG. 10 is a top plan view of the FIG. 8 device;

FIG. 11 is a left side elevation view of the FIG. 8 device;

FIG. 12 is a right side elevation view of the FIG. 8 device; and,

FIG. 13 is a rear elevation plan view of the FIG. 8 device.

Claims

The ornamental design for an analytical instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
4184485 January 22, 1980 Agoston
D261033 September 29, 1981 Armbruster
4293916 October 6, 1981 Del Re et al.
4301414 November 17, 1981 Hill et al.
D266151 September 14, 1982 Dawson
D285114 August 12, 1986 Collister et al.
4623793 November 18, 1986 Hofke et al.
5644239 July 1, 1997 Huang et al.
6607920 August 19, 2003 Jennings et al.
6707043 March 16, 2004 Coates et al.
8394637 March 12, 2013 Schulat et al.
Patent History
Patent number: D685277
Type: Grant
Filed: Dec 17, 2012
Date of Patent: Jul 2, 2013
Assignee: Mettler-Toledo AG (Greifensee)
Inventors: Patrick Ammon (Brügg), Yves Marmier (La Chaux-de-Fonds), Chong Zhu (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/439,857
Classifications
Current U.S. Class: Chemical (12) (D10/81)