Testing apparatus

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Description

This application is related to (1) U.S. Design application Ser. No. 29/389,609, filed Apr. 14, 2011, which claims priority to European Community Design Application Nos. 001768425-0005 and 001768425-0006, filed Oct. 14, 2010 in the European (EU) Office for Harmonization in the Internal Market (OHIM); (2) U.S. Design application Ser. No. 29/389,613, filed Apr. 14, 2011, which claims priority to European Community Design Application Nos. 001768425-0003 and 001768425-0006, filed Oct. 14, 2010 in the European (EU) Office for Harmonization in the Internal Market (OHIM); (3) U.S. Design application Ser. No. 29/389,679, filed Apr. 14, 2011, which claims priority to European Community Design Application Nos. 001768425-0001, 001768425-0002, 001768425-0005 and 001768425-0006, filed Oct. 14, 2010 in the European (EU) Office for Harmonization in the Internal Market (OHIM); and (4) U.S. Design application Ser. No. 29/389,680, filed Apr. 14, 2011, which claims priority to European Community Design Application Nos. 001768425-0001 and 001768425-0006, filed Oct. 14, 2010 in the European (EU) Office for Harmonization in the Internal Market (OHIM), the entire disclosures of which are incorporated herein by reference.

FIG. 1 is a perspective view of a testing apparatus showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a left side elevational view thereof, the right side elevational view being a mirror image;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

The broken lines in the drawing views are included for the purpose of illustrating portions of the testing apparatus that form no part of the claimed design.

Claims

The ornamental design for a testing apparatus, as shown and described.

Referenced Cited
U.S. Patent Documents
D383549 September 9, 1997 Arnett et al.
D443693 June 12, 2001 Shoji et al.
D497999 November 2, 2004 Long
D499812 December 14, 2004 Wu
D523964 June 27, 2006 Phelan et al.
D531735 November 7, 2006 Lee et al.
D536798 February 13, 2007 Lee et al.
D537531 February 27, 2007 Sigel et al.
D548359 August 7, 2007 Illein et al.
D574966 August 12, 2008 Laverack
D575876 August 26, 2008 Laverack
D575877 August 26, 2008 Laverack
D592759 May 19, 2009 Laverack
Other references
  • U.S. Appl. No. 29/389,609, filed Apr. 14, 2011, Laverack et al.
  • U.S. Appl. No. 29/389,613, filed Apr. 14, 2011, Laverack et al.
  • U.S. Appl. No. 29/389,679, filed Apr. 14, 2011, Laverack et al.
  • U.S. Appl. No. 29/389,680, filed Apr. 14, 2011, Laverack et al.
Patent History
Patent number: D694903
Type: Grant
Filed: Apr 14, 2011
Date of Patent: Dec 3, 2013
Assignee: SPD Swiss Precision Diagnostics GmbH (Geneva)
Inventors: Paul Laverack (Milton Keynes), Richard Luxton (Leighton Buzzard), James Gani (Bedfordshire)
Primary Examiner: Anhdao Doan
Application Number: 29/389,605