FIG. 1 is a perspective view of the test fixture for scanning probe microscopy, installed on an unclaimed three-axis stage.
FIG. 2 is an alternate perspective view of the test fixture for scanning probe microscopy of FIG. 1.
FIG. 3 rear elevation of the test fixture for scanning probe microscopy of FIG. 1.
FIG. 4 is a perspective view of the test fixture for scanning probe microscopy.
FIG. 5 is a left elevation of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 6 is a right elevation of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 7 is a front elevation of the armature of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 8 is a front elevation of the stage of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 9 is a rear elevation of the armature of test fixture for scanning probe microscopy of FIG. 4.
FIG. 10 is a rear elevation of the stage of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 11 is a top plan view of the armature of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 12 is a top plan view of the stage of the test fixture for scanning probe microscopy of FIG. 4.
FIG. 13 is a bottom plan view of the armature of the test fixture for scanning probe microscopy of FIG. 4; and,
FIG. 14 is a bottom plan view of the stage of the test fixture for scanning probe microscopy of FIG. 4.
The broken lines in FIGS. 1, 2, and 3 depict environment and do not form a basis of the claimed design.
