Test device
Latest Fluke Corporation Patents:
Description
The broken lines in
Claims
The ornamental design for a test device, as shown and described.
Referenced Cited
U.S. Patent Documents
| 4834532 | May 30, 1989 | Yount |
| 4968137 | November 6, 1990 | Yount |
| 5134284 | July 28, 1992 | Volgyesi |
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| 5553622 | September 10, 1996 | McKown |
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| RE37970 | January 28, 2003 | Costello, Jr. |
| D669802 | October 30, 2012 | Marzynski et al. |
| D677184 | March 5, 2013 | Kluser et al. |
| 20120130204 | May 24, 2012 | Basta |
Patent History
Patent number: D701780
Type: Grant
Filed: Oct 5, 2012
Date of Patent: Apr 1, 2014
Assignee: Fluke Corporation (Everett, WA)
Inventors: Matthew Marzynski (Seattle, WA), Miguel Herrera (Bellingham, WA)
Primary Examiner: Antoine D Davis
Application Number: 29/433,887
Type: Grant
Filed: Oct 5, 2012
Date of Patent: Apr 1, 2014
Assignee: Fluke Corporation (Everett, WA)
Inventors: Matthew Marzynski (Seattle, WA), Miguel Herrera (Bellingham, WA)
Primary Examiner: Antoine D Davis
Application Number: 29/433,887
Classifications
Current U.S. Class:
Electrical Property (D10/75)