Test device

- Fluke Corporation
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Description

FIG. 1 is a front top right isometric view of a test device according to one embodiment showing our new design;

FIG. 2 is a rear bottom left isometric view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a rear elevation view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a left side elevation view thereof; and,

FIG. 8 is a right side elevation view thereof.

The broken lines in FIGS. 1-5, 7, and 8 illustrate environmental subject matter and form no part of the claimed design.

Claims

The ornamental design for a test device, as shown and described.

Referenced Cited
U.S. Patent Documents
4834532 May 30, 1989 Yount
4968137 November 6, 1990 Yount
5134284 July 28, 1992 Volgyesi
5166517 November 24, 1992 Volgyesi
5553622 September 10, 1996 McKown
5588438 December 31, 1996 McKown
5755670 May 26, 1998 McKown
5783821 July 21, 1998 Costello, Jr.
RE36620 March 21, 2000 Costello, Jr.
6400973 June 4, 2002 Winter
RE37970 January 28, 2003 Costello, Jr.
D669802 October 30, 2012 Marzynski et al.
D677184 March 5, 2013 Kluser et al.
20120130204 May 24, 2012 Basta
Patent History
Patent number: D701780
Type: Grant
Filed: Oct 5, 2012
Date of Patent: Apr 1, 2014
Assignee: Fluke Corporation (Everett, WA)
Inventors: Matthew Marzynski (Seattle, WA), Miguel Herrera (Bellingham, WA)
Primary Examiner: Antoine D Davis
Application Number: 29/433,887
Classifications
Current U.S. Class: Electrical Property (D10/75)