Constant temperature chamber
Latest Espec Corp. Patents:
- SNOW ACCRETION TEST METHOD AND SNOW ACCRETION TEST DEVICE
- SNOW ENVIRONMENT TEST APPARATUS AND SNOW ENVIRONMENT TEST METHOD
- SNOW ENVIRONMENT TEST APPARATUS AND SNOW ENVIRONMENT TEST METHOD
- ENVIRONMENTAL TEST APPARATUS
- SETTING DEVICE, COMPUTER-READABLE RECORDING MEDIUM THAT RECORDS PROGRAM, ENVIRONMENT FORMING DEVICE, AND SETTING METHOD
Description
The portion shown by broken lines is for illustrative purposes only and forms no part of the claimed design.
The dashed lines show a borderline between the claimed design and other portion.
Claims
The ornamental design for a constant temperature chamber, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
5859540 | January 12, 1999 | Fukumoto |
20110247782 | October 13, 2011 | Chou et al. |
2000-146821 | May 2000 | JP |
Patent History
Patent number: D705676
Type: Grant
Filed: May 20, 2013
Date of Patent: May 27, 2014
Assignee: Espec Corp. (Osaka)
Inventor: Osamu Matsuguma (Osaka)
Primary Examiner: Antoine D Davis
Application Number: 29/455,294
Type: Grant
Filed: May 20, 2013
Date of Patent: May 27, 2014
Assignee: Espec Corp. (Osaka)
Inventor: Osamu Matsuguma (Osaka)
Primary Examiner: Antoine D Davis
Application Number: 29/455,294
Classifications
Current U.S. Class:
Temperature, Humidity, Atmospheric Condition (3) (D10/52)