Scanner for a magnetic resonance tomography diagnosis apparatus

- Kabushiki Kaisha Toshiba
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Description

FIG. 1 is a front perspective view of a scanner for a magnetic resonance tomography diagnosis apparatus, showing my design

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a cross sectional view thereof, taken along the line 8-8 in FIG. 2; and,

FIG. 9 is an enlarged view thereof, taken along the line 9-9 in FIG. 8.

The broken lines are for illustrative purpose only and form no part of the claimed design. The uneven spaced broken lines define the bounds of the claimed design and form no part thereof.

The recess visible in the cross section extends consistently around the center region from 7 o'clock to 5 o'clock.

The radial lines emanating from around the center region in FIGS. 1, 2, and 4-9 indicate illumination.

Claims

The ornamental design for a scanner for a magnetic resonance tomography diagnosis apparatus, as shown and described.

Referenced Cited
U.S. Patent Documents
D399958 October 20, 1998 Hiramatsu
D420134 February 1, 2000 Kitayama
D557418 December 11, 2007 Onuma et al.
D564096 March 11, 2008 Banryu
D625416 October 12, 2010 Kasai et al.
D628294 November 30, 2010 Baba
Foreign Patent Documents
1312242 October 2007 JP
1312245 October 2007 JP
1370351 October 2009 JP
Other references
  • Extract of Nikkei Sangyo Shimbun (Newspaper), Showing a magnetic resonance imaging, (Siemens-Asahi Medical Technologies Ltd/ Magnetom Essenza).
  • Extract of Nikkei Sangyo Shimbun (Newspaper), Showing a magnetic resonance imaging, (Siemens AG/Type 3T).
Patent History
Patent number: D706424
Type: Grant
Filed: May 21, 2012
Date of Patent: Jun 3, 2014
Assignees: Kabushiki Kaisha Toshiba (Minato-Ku, Tokyo), Toshiba Medical Systems Corporation (Otawara-Shi, Tochigi-Ken)
Inventor: Atsunobu Banryu (Funabashi)
Primary Examiner: Anhdao Doan
Application Number: 29/422,452
Classifications