Model of lachrymal duct
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Description
The broken lines are for illustrative purposes only and form no part of the claimed design. Also, the alternate and short dash lines in
Claims
The ornamental design for a model of lachrymal duct, as shown and described.
Referenced Cited
U.S. Patent Documents
| 2053357 | September 1936 | Winder |
| 3613265 | October 1971 | Stern et al. |
| 3802096 | April 1974 | Matern |
| D256373 | August 12, 1980 | Marks |
| D258668 | March 24, 1981 | Moss |
| 4288222 | September 8, 1981 | Kling |
| 4938696 | July 3, 1990 | Foster et al. |
| 5090910 | February 25, 1992 | Narlo |
| 5807311 | September 15, 1998 | Palestrant |
| D413629 | September 7, 1999 | Wolff |
| 6321782 | November 27, 2001 | Hollister |
| 6428513 | August 6, 2002 | Abrahamson |
| D498819 | November 23, 2004 | Goetz et al. |
| 6872198 | March 29, 2005 | Wilson et al. |
| D534216 | December 26, 2006 | Makower et al. |
| 7377915 | May 27, 2008 | Rasmussen et al. |
| 7875019 | January 25, 2011 | Barron et al. |
| 7883502 | February 8, 2011 | Powers et al. |
| 8021321 | September 20, 2011 | Zawacki |
| 8529544 | September 10, 2013 | Haarala et al. |
| 8617116 | December 31, 2013 | Davey |
| 20030153898 | August 14, 2003 | Schon et al. |
Patent History
Patent number: D716869
Type: Grant
Filed: Dec 13, 2012
Date of Patent: Nov 4, 2014
Assignee: Kaneka Corporation (Osaka-Shi)
Inventors: Kohei Fukaya (Settsu), Mariko Matsumoto (Settsu)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/439,622
Type: Grant
Filed: Dec 13, 2012
Date of Patent: Nov 4, 2014
Assignee: Kaneka Corporation (Osaka-Shi)
Inventors: Kohei Fukaya (Settsu), Mariko Matsumoto (Settsu)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/439,622
Classifications
Current U.S. Class:
Demonstrator Or Exhibitor (10) (D19/62)