Test device

- Omicron Electronics GmbH
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Description

FIG. 1 shows a perspective view of a first design with elements being grouped in a plurality of groups, each of the groups being surrounded by a rectangular frame having a lower right corner that has a 45° edge.

FIG. 2 shows a second embodiment of a front view of the design of FIG. 1; and,

FIG. 3 shows a third embodiment of a front view of the design of FIG. 1.

The design relates to test devices for power engineering systems and power engineering components in which an arbitrary number of elements, such as input ports, output ports or status displays, are grouped in a group being surrounded by a polygonal frame. The corners of the polygonal frame are rectangular except for the lower right corner. The lower right corner of the polygonal frame has a 45° edge. Each group may have a group label in a frame which is arranged directly above the group and has the same width.

Claims

The ornamental design for a test device, as shown and described.

Referenced Cited
U.S. Patent Documents
D639753 June 14, 2011 Saari
D679665 April 9, 2013 Saari
Patent History
Patent number: D721606
Type: Grant
Filed: Jun 21, 2013
Date of Patent: Jan 27, 2015
Assignee: Omicron Electronics GmbH
Inventor: Simon Mayr (Feldkirch)
Primary Examiner: Antoine D Davis
Application Number: 29/458,646