Test device
Latest Omicron Electronics GmbH Patents:
- High current source for a test system for testing an electrical power device, and test system
- Method and apparatus for determining a state of capacitive voltage transformer
- HIGH CURRENT SOURCE FOR A TEST SYSTEM FOR TESTING AN ELECTRICAL POWER DEVCE, AND TEST SYSTEM
- METHOD AND APPARATUS FOR DETERMINING A STATE OF CAPACITIVE VOLTAGE TRANSFORMER
- METHOD AND DEVICE FOR PERSONAL PROTECTION DURING HIGH-VOLTAGE TESTING
The design relates to test devices for power engineering systems and power engineering components in which an arbitrary number of elements, such as input ports, output ports or status displays, are grouped in a group being surrounded by a polygonal frame. The corners of the polygonal frame are rectangular except for the lower right corner. The lower right corner of the polygonal frame has a 45° edge. Each group may have a group label in a frame which is arranged directly above the group and has the same width.
Claims
The ornamental design for a test device, as shown and described.
Type: Grant
Filed: Jun 21, 2013
Date of Patent: Jan 27, 2015
Assignee: Omicron Electronics GmbH
Inventor: Simon Mayr (Feldkirch)
Primary Examiner: Antoine D Davis
Application Number: 29/458,646