Specimen analysis apparatus
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The eneven broken line in
Claims
The ornamental design for a specimen analysis apparatus, as shown and described.
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Type: Grant
Filed: Feb 24, 2015
Date of Patent: Aug 4, 2015
Assignees: Kabushiki Kaisha Toshiba (Minato-ku, Tokyo), Toshiba Medical Systems Corporation (Otawara-shi, Tochigi-ken)
Inventor: Shianwei Chang (Kanagawa)
Primary Examiner: Anhdao Doan
Application Number: 29/518,489