Specimen analysis apparatus

- Kabushiki Kaisha Toshiba
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Description

FIG. 1 is a front, top and right side perspective view of a specimen analysis apparatus, showing my new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof;

FIG. 7 is a bottom view thereof;

FIG. 8 is an enlarged cross sectional view thereof, taken along the line 8-8 in FIG. 6 with its internal mechanisms omitted; and,

FIG. 9 is a perspective view showing a state in which a slide cover is slid to open.

The eneven broken line in FIG. 6 is included to indicate the cutting plane of FIG. 8. The broken lines are for illustrative purpose only and form no part of the claimed design.

Claims

The ornamental design for a specimen analysis apparatus, as shown and described.

Referenced Cited
U.S. Patent Documents
D638545 May 24, 2011 Okawa et al.
D647209 October 18, 2011 Muller et al.
D655421 March 6, 2012 Lee et al.
D665917 August 21, 2012 TerMaat et al.
8298484 October 30, 2012 Takagi et al.
D689193 September 3, 2013 Shinohara et al.
D717968 November 18, 2014 Klein et al.
D730535 May 26, 2015 Gutmann et al.
Foreign Patent Documents
S1386808 May 2010 JP
S1399185 October 2010 JP
S1400050 November 2010 JP
S1457056 December 2012 JP
Patent History
Patent number: D735878
Type: Grant
Filed: Feb 24, 2015
Date of Patent: Aug 4, 2015
Assignees: Kabushiki Kaisha Toshiba (Minato-ku, Tokyo), Toshiba Medical Systems Corporation (Otawara-shi, Tochigi-ken)
Inventor: Shianwei Chang (Kanagawa)
Primary Examiner: Anhdao Doan
Application Number: 29/518,489
Classifications