Sensor housing
Description
The broken lines depict the portions of a sensor housing in which the design is embodied and form no part of the claimed design.
Claims
The ornamental design for a sensor housing, as shown and described.
Referenced Cited
U.S. Patent Documents
| D340253 | October 12, 1993 | Fedorczak |
| D388450 | December 30, 1997 | Hamano et al. |
| D399517 | October 13, 1998 | Hasegawa |
| D402677 | December 15, 1998 | Hiraguchi |
| 6525766 | February 25, 2003 | Ikoma et al. |
| D473888 | April 29, 2003 | Jones et al. |
| D486509 | February 10, 2004 | Suzuki |
| D489742 | May 11, 2004 | Nagai |
| D502196 | February 22, 2005 | Miyazaki |
| D517585 | March 21, 2006 | Iino et al. |
| D518080 | March 28, 2006 | Uehara |
| D536357 | February 6, 2007 | Koby |
| D542319 | May 8, 2007 | Ishida et al. |
| D545860 | July 3, 2007 | Miyazaki |
| D550738 | September 11, 2007 | Hsia |
| D552148 | October 2, 2007 | Yamakawa et al. |
| D552650 | October 9, 2007 | Yamakawa et al. |
| D556803 | December 4, 2007 | Ishida |
| D562870 | February 26, 2008 | Komatsu et al. |
| D574870 | August 12, 2008 | Takahashi |
| D579474 | October 28, 2008 | Yoo et al. |
| 7435019 | October 14, 2008 | Lee |
| 7446813 | November 4, 2008 | Nakamoto et al. |
| D583845 | December 30, 2008 | Hayashi et al. |
| D608811 | January 26, 2010 | Frank et al. |
| D609732 | February 9, 2010 | Frank et al. |
| D627815 | November 23, 2010 | Oba |
| D676477 | February 19, 2013 | Chen et al. |
| 20080267611 | October 30, 2008 | Huang |
Patent History
Patent number: D737698
Type: Grant
Filed: Nov 7, 2013
Date of Patent: Sep 1, 2015
Assignee: FLIR Systems, Inc. (Wilsonville, OR)
Inventors: Jace Dispenza (Santa Barbara, CA), Michael Kent (Santa Barbara, CA), Patrick B. Richardson (Santa Barbara, CA), Zhenmei Mao (Shanghai)
Primary Examiner: Adir Aronovich
Application Number: 29/472,052
Type: Grant
Filed: Nov 7, 2013
Date of Patent: Sep 1, 2015
Assignee: FLIR Systems, Inc. (Wilsonville, OR)
Inventors: Jace Dispenza (Santa Barbara, CA), Michael Kent (Santa Barbara, CA), Patrick B. Richardson (Santa Barbara, CA), Zhenmei Mao (Shanghai)
Primary Examiner: Adir Aronovich
Application Number: 29/472,052
Classifications