Probe for peening inspection

- Sintokogio, Ltd.
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Description

FIG. 1 is a front bottom perspective view of a probe for peening inspection showing my new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The circular structures illustrated at 9 o'clock, 12 o'clock and 3 o'clock in FIGS. 2 and 3 are through-holes.

The article is shown with a symbolic break in its length. The appearance of any portion of the article between the break lines forms no part of the claimed design.

Claims

The ornamental design for a probe for peening inspection, as shown and described.

Referenced Cited
U.S. Patent Documents
D572158 July 1, 2008 Radecke et al.
D577300 September 23, 2008 Radecke et al.
20120049842 March 1, 2012 Setbacken et al.
20150002144 January 1, 2015 Boecker et al.
Patent History
Patent number: D744360
Type: Grant
Filed: Jun 26, 2014
Date of Patent: Dec 1, 2015
Assignee: Sintokogio, Ltd.
Inventor: Yoshiyasu Makino (Toyokawa)
Primary Examiner: Antoine D Davis
Application Number: 29/495,016
Classifications