Radiation probe

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Description

FIG. 1 is a perspective view of a radiation probe showing our new design;

FIG. 2 is a top view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a bottom view thereof;

FIG. 5 is a rear view thereof;

FIG. 6 is a left side view thereof; and,

FIG. 7 is a right side view thereof.

The broken lines depict portions of the radiation probe that form no part of the claimed design.

Claims

The ornamental design for a radiation probe, as shown and described.

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Patent History
Patent number: D747496
Type: Grant
Filed: May 30, 2013
Date of Patent: Jan 12, 2016
Assignee: University of the Witswatersrand, Johannesburg (Johannesburg)
Inventors: Nicholas Ade (Johannesburg), Tom Leong Nam (Johannesburg)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Mark Cavanna
Application Number: 29/456,332