Soil probe

Info

Patent number: D747939
Type: Grant
Filed: Jun 4, 2014
Date of Patent: Jan 26, 2016
Assignee: Soil IQ, Inc. (San Francisco, CA)
Inventors: Yves Behar (San Francisco, CA), Liam Adelman (San Francisco, CA), Jason Lee Aramburu (San Francisco, CA)
Primary Examiner: Sheryl Lane
Assistant Examiner: Ieisha Price
Application Number: 29/493,003

Description

Description

FIG. 1 is a left side elevation view of both the first and second embodiment of the soil probe;

FIG. 2 is a front elevation view of both the first and second embodiment of the soil probe;

FIG. 3 is a right side elevation view of both the first and second embodiment of the soil probe;

FIG. 4 is a back elevation view of both the first and second embodiment of the soil probe;

FIG. 5 is a top left isometric view of the first embodiment of the soil probe, including a solar panel;

FIG. 6 is a bottom right isometric view of both the first and second embodiment of the soil probe;

FIG. 7 is a top plan view of the first embodiment of the soil probe, including the solar panel;

FIG. 8 is a bottom plan view of both the first and second embodiment of the soil probe;

FIG. 9 is a top plan view of the second embodiment of the soil probe; and,

FIG. 10 is a top left isometric view of the second embodiment of the soil probe.

Claims

The ornamental design for a soil probe, as shown and described.