Grain inspection device

- Satake Corporation
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Description

FIG. 1 is a left front perspective view of a grain inspection device showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines in the drawings are included for the purpose of illustrating portions of the grain inspection device and form no part of the claimed design.

Claims

We claim the ornamental design for a grain inspection device, as shown and described.

Referenced Cited
U.S. Patent Documents
D367023 February 13, 1996 Benson
D565617 April 1, 2008 Chang et al.
D576639 September 9, 2008 Uenohara
D654937 February 28, 2012 Fader et al.
D712936 September 9, 2014 Wilhelmi et al.
Foreign Patent Documents
1144560 June 2002 JP
1193353 January 2004 JP
1206499 May 2004 JP
Patent History
Patent number: D748152
Type: Grant
Filed: Oct 10, 2013
Date of Patent: Jan 26, 2016
Assignee: Satake Corporation
Inventors: Hideaki Matsushima (Tokyo), Hiroki Ishizuki (Tokyo), Manabu Ikeda (Tokyo), Jun Zheng (Tokyo)
Primary Examiner: Cynthia Ramirez
Assistant Examiner: Gino Colan
Application Number: 29/469,414
Classifications