Grain inspection device
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Description
The broken lines in the drawings are included for the purpose of illustrating portions of the grain inspection device and form no part of the claimed design.
Claims
We claim the ornamental design for a grain inspection device, as shown and described.
Referenced Cited
Patent History
Patent number: D748152
Type: Grant
Filed: Oct 10, 2013
Date of Patent: Jan 26, 2016
Assignee: Satake Corporation
Inventors: Hideaki Matsushima (Tokyo), Hiroki Ishizuki (Tokyo), Manabu Ikeda (Tokyo), Jun Zheng (Tokyo)
Primary Examiner: Cynthia Ramirez
Assistant Examiner: Gino Colan
Application Number: 29/469,414
Type: Grant
Filed: Oct 10, 2013
Date of Patent: Jan 26, 2016
Assignee: Satake Corporation
Inventors: Hideaki Matsushima (Tokyo), Hiroki Ishizuki (Tokyo), Manabu Ikeda (Tokyo), Jun Zheng (Tokyo)
Primary Examiner: Cynthia Ramirez
Assistant Examiner: Gino Colan
Application Number: 29/469,414
Classifications
Current U.S. Class:
Element Or Attachment (4) (D15/28)