Diagnostic device
Latest WELCH ALLYN, INC. Patents:
Description
The broken lines immediately adjacent the shaded areas represent the bounds of the claim. All other broken lines are directed to unclaimed portions of the diagnostic device. None of the broken lines form a part of the claimed design.
Claims
The ornamental design for a diagnostic device, as shown and described.
Referenced Cited
U.S. Patent Documents
D460559 | July 16, 2002 | Knieriem |
D512151 | November 29, 2005 | Ward |
D535031 | January 9, 2007 | Barrett |
D536794 | February 13, 2007 | Knieriem |
D635681 | April 5, 2011 | Edwards |
D641885 | July 19, 2011 | Wawro |
D671020 | November 20, 2012 | Collins |
D725784 | March 31, 2015 | Xia |
D735343 | July 28, 2015 | Dorsey |
20080281168 | November 13, 2008 | Gibson |
20100056886 | March 4, 2010 | Hurtubise |
20110071420 | March 24, 2011 | St. Pierre |
20140058213 | February 27, 2014 | Abu-Tarif |
Patent History
Patent number: D748807
Type: Grant
Filed: Sep 5, 2014
Date of Patent: Feb 2, 2016
Assignee: WELCH ALLYN, INC. (Skaneateles Falls, NY)
Inventors: Thaddeus J. Wawro (Auburn, NY), Donwoong Kang (Camillus, NY), Jonathan A. Fitch (Syracuse, NY), Alan S. Knieriem (Baldwinsville, NY), Scott W. Osiecki (Skaneateles, NY), Shawn C. St. Pierre (Syracuse, NY)
Primary Examiner: Anhdao Doan
Application Number: 29/501,553
Type: Grant
Filed: Sep 5, 2014
Date of Patent: Feb 2, 2016
Assignee: WELCH ALLYN, INC. (Skaneateles Falls, NY)
Inventors: Thaddeus J. Wawro (Auburn, NY), Donwoong Kang (Camillus, NY), Jonathan A. Fitch (Syracuse, NY), Alan S. Knieriem (Baldwinsville, NY), Scott W. Osiecki (Skaneateles, NY), Shawn C. St. Pierre (Syracuse, NY)
Primary Examiner: Anhdao Doan
Application Number: 29/501,553
Classifications
Current U.S. Class:
Patient Monitor Or Diagnostic Instrument Not Elsewhere Specified (50) (D24/186)