Digital multimeter
Latest Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Patents:
The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.
Claims
The ornamental design for a digital multimeter, as shown and described.
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Type: Grant
Filed: Mar 2, 2015
Date of Patent: Apr 19, 2016
Assignee: Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. (Shanghai)
Inventor: Yurui Shen (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/519,136