Digital multimeter

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Description

FIG. 1 is a front elevation view of a digital multimeter showing my new design;

FIG. 2 is a rear elevation view thereof;

FIG. 3 is a left side elevation view thereof;

FIG. 4 is a right side elevation view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a bottom front right perspective view thereof;

FIG. 8 is a front elevation view of another embodiment of a digital multimeter showing my new design;

FIG. 9 is a rear elevation view thereof;

FIG. 10 is a left side elevation view thereof;

FIG. 11 is a right side elevation view thereof;

FIG. 12 is a top plan view thereof;

FIG. 13 is a bottom plan view thereof;

FIG. 14 is a bottom front right perspective view thereof;

FIG. 15 is a front elevation view of another embodiment of a digital multimeter showing my new design;

FIG. 16 is a rear elevation view thereof;

FIG. 17 is a left side elevation view thereof;

FIG. 18 is a right side elevation view thereof;

FIG. 19 is a top plan view thereof;

FIG. 20 is a bottom plan view thereof; and,

FIG. 21 is a bottom front right perspective view thereof.

The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.

Claims

The ornamental design for a digital multimeter, as shown and described.

Referenced Cited
U.S. Patent Documents
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D412450 August 3, 1999 McCain
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D625633 October 19, 2010 Laurino
7990162 August 2, 2011 Eng, Jr.
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8358121 January 22, 2013 Hudson
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8466671 June 18, 2013 Worones
D704579 May 13, 2014 Heishi
D705099 May 20, 2014 Heishi
D705681 May 27, 2014 Morishita
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D731908 June 16, 2015 Huang
Patent History
Patent number: D754010
Type: Grant
Filed: Mar 2, 2015
Date of Patent: Apr 19, 2016
Assignee: Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. (Shanghai)
Inventor: Yurui Shen (Shanghai)
Primary Examiner: Antoine D Davis
Application Number: 29/519,136
Classifications