Probe pin
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Description
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.
Claims
The ornamental design for a probe pin, as shown and described.
Referenced Cited
Patent History
Patent number: D788615
Type: Grant
Filed: Aug 5, 2016
Date of Patent: Jun 6, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/573,425
Type: Grant
Filed: Aug 5, 2016
Date of Patent: Jun 6, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/573,425
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/80)