Probe pin
Latest OMRON Corporation Patents:
- Power outlet with a movable contact and releasable holding mechanism
- Information processing device, information processing method, and information processing program
- Work instruction system and work instruction method
- Output control device, distance measuring device comprising the same, output control method, and output control program
- DISPLAY SWITCHING DEVICE, SWITCH, AND ELECTRICAL APPARATUS
Description
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.
Claims
The ornamental design for a probe pin, as shown and described.
Referenced Cited
Patent History
Patent number: D788615
Type: Grant
Filed: Aug 5, 2016
Date of Patent: Jun 6, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/573,425
Type: Grant
Filed: Aug 5, 2016
Date of Patent: Jun 6, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/573,425
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/80)