Probe pin

- OMRON Corporation
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Description

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
8715015 May 6, 2014 Hwang
9124012 September 1, 2015 Sakai
9130290 September 8, 2015 Sakai
9322846 April 26, 2016 Sakai
Other references
  • Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO.
  • Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,446, filed Aug. 5, 2016, in the USPTO.
Patent History
Patent number: D788616
Type: Grant
Filed: Aug 5, 2016
Date of Patent: Jun 6, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/573,439
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)