Probe pin

- OMRON Corporation
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Description

FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

Claims

The ornamental design for a probe pin, as shown.

Referenced Cited
U.S. Patent Documents
7789671 September 7, 2010 Hsieh
7815440 October 19, 2010 Hsieh
8033872 October 11, 2011 Yang
8547128 October 1, 2013 Sochor
8669774 March 11, 2014 Kato
8715015 May 6, 2014 Hwang
8808038 August 19, 2014 Hwang
Other references
  • Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,425, filed Aug. 5, 2016, in the USPTO.
  • Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,439, filed Aug. 5, 2016, in the USPTO.
  • Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO.
Patent History
Patent number: D789224
Type: Grant
Filed: Aug 5, 2016
Date of Patent: Jun 13, 2017
Assignee: OMRON Corporation (Kyoto)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/573,446
Classifications