Metrology training device

- RENISHAW PLC
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Description

FIG. 1 is a top, front, right-side perspective view of the metrology training device;

FIG. 2 is a front plan view thereof;

FIG. 3 is a back plan view thereof;

FIG. 4 is a left-side elevational view thereof;

FIG. 5 is a right-side elevational view thereof;

FIG. 6 is a top elevational view thereof; and,

FIG. 7 is a bottom elevational view thereof.

The broken lines depict portions that form no part of the claimed design.

Claims

The ornamental design for a metrology training device, as shown and described.

Referenced Cited
U.S. Patent Documents
D193659 September 1962 Matricardi
D219216 November 1970 Speers
4487585 December 11, 1984 Goldwasser
D397382 August 25, 1998 Gensler
D429775 August 22, 2000 Adelman
6354841 March 12, 2002 Bradt
D480116 September 30, 2003 Collins
D589708 April 7, 2009 Marek
D611985 March 16, 2010 Puglisi
D627550 November 23, 2010 Zhang
8020867 September 20, 2011 Cheng
8602833 December 10, 2013 Binder
D698095 January 21, 2014 Paculdo
D734896 July 21, 2015 Mam
D737905 September 1, 2015 Klemm
D754801 April 26, 2016 Fox
D759166 June 14, 2016 Fox
9403084 August 2, 2016 Klemm
20050184459 August 25, 2005 Marantz
20050200076 September 15, 2005 Wu
20070164513 July 19, 2007 Gelman
Other references
  • <https://www.youtube.com/watch?v=mYsAEwbEqyE> uploaded on May 26, 2014.
Patent History
Patent number: D789450
Type: Grant
Filed: Oct 14, 2014
Date of Patent: Jun 13, 2017
Assignee: RENISHAW PLC (Wotton-Under-Edge)
Inventors: Paul Maxted (Bristol), Stuart Howell (Bristol)
Primary Examiner: Ian Simmons
Assistant Examiner: Mark Cavanna
Application Number: 29/506,251
Classifications