Probe pin

- OMRON Corporation
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Description

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof, a rear elevational view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the PROBE PIN that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
6784680 August 31, 2004 Haga
7190179 March 13, 2007 Haga
Other references
  • U.S. Appl. No. 29/563,343, filed May 4, 2016; Teranishi et al.
  • U.S. Appl. No. 29/563,347, filed May 4, 2016; Teranishi et al.
Patent History
Patent number: D792254
Type: Grant
Filed: May 4, 2016
Date of Patent: Jul 18, 2017
Assignee: OMRON Corporation (Kyoto-shi)
Inventors: Hirotada Teranishi (Osaka), Takahiro Sakai (Moriyama), Makoto Kondo (Moriyama)
Primary Examiner: Antoine D Davis
Application Number: 29/563,345