Residual stress measuring device
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Description
The drawings include surface shading which represents contour and not surface ornamentation.
The broken lines show portions of a residual stress measuring device that form no part of the claimed design.
Claims
The ornamental design for a residual stress measuring device, as shown and described.
Referenced Cited
U.S. Patent Documents
2950620 | August 1960 | Magill |
D273039 | March 13, 1984 | Behrens |
D277835 | March 5, 1985 | Nonnast |
D307284 | April 17, 1990 | Del Corno |
D328257 | July 28, 1992 | Ormand |
D392300 | March 17, 1998 | Chow |
D648742 | November 15, 2011 | Ward |
D707900 | June 24, 2014 | Ediger |
D718643 | December 2, 2014 | Joung |
D768225 | October 4, 2016 | Hirose |
D769211 | October 18, 2016 | Schnell |
Patent History
Patent number: D799345
Type: Grant
Filed: Jun 16, 2016
Date of Patent: Oct 10, 2017
Assignee: Sintokogio, Ltd.
Inventors: Kyoichi Iwata (Toyokawa), Takuya Koyama (Toyokawa)
Primary Examiner: Melanie H Tung
Assistant Examiner: Fritzgerald Butac
Application Number: 29/568,267
Type: Grant
Filed: Jun 16, 2016
Date of Patent: Oct 10, 2017
Assignee: Sintokogio, Ltd.
Inventors: Kyoichi Iwata (Toyokawa), Takuya Koyama (Toyokawa)
Primary Examiner: Melanie H Tung
Assistant Examiner: Fritzgerald Butac
Application Number: 29/568,267
Classifications