Probe handle

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Description

FIG. 1 is a left, front and top perspective view of a probe handle, showing our new design;

FIG. 2 is a right, back and bottom perspective view of the probe handle of FIG. 1;

FIG. 3 is a left side view of the probe handle of FIG. 1;

FIG. 4 is a front view of the probe handle of FIG. 1;

FIG. 5 is a right side view of the probe handle of FIG. 1;

FIG. 6 is a back view of the probe handle of FIG. 1;

FIG. 7 is a top view of the probe handle of FIG. 1; and,

FIG. 8 is a bottom view of the probe handle of FIG. 1.

The broken lines immediately adjacent the shaded areas represent the bounds of the claimed design while all other broken lines are directed to environment and are for illustrative purposes only; the broken lines form no part of the claimed design.

Claims

The ornamental design for a probe handle, as shown and described.

Referenced Cited
U.S. Patent Documents
7442191 October 28, 2008 Hovda
D634849 March 22, 2011 Kanokogi
D667557 September 18, 2012 Boudier
D679021 March 26, 2013 Tani
D691718 October 15, 2013 Ryan
D704844 May 13, 2014 Saeki
D746995 January 5, 2016 Matsumura
Patent History
Patent number: D802777
Type: Grant
Filed: Oct 14, 2015
Date of Patent: Nov 14, 2017
Assignee: Kyphon SÀRL (Neuchâtel)
Inventors: Natalia Burachynsky (Toronto), Neil Godara (Milton), Zhifeng Zhou (Toronto), Larry Henan Chen (Guelph), Robert Harrison (Milton)
Primary Examiner: Wan Laymon
Application Number: 29/542,486