Trace analysis instrument

- FLIR Detection, Inc.
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Description

FIG. 1 is a perspective view of the trace analysis instrument embodying our new design.

FIG. 2 is a side elevational view thereof.

FIG. 3 is a side elevational view thereof.

FIG. 4 is a top plan view thereof.

FIG. 5 is a bottom plan view thereof.

FIG. 6 is a side elevational view thereof.

FIG. 7 is a side elevational view thereof; and,

FIG. 8 is another perspective view thereof.

The broken lines in the figures are shown for the purpose of illustrating portions of the trace analysis instrument and/or environmental matter and form no part of the claimed design.

Claims

The ornamental design for a trace analysis instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D330171 October 13, 1992 Wilson
D333441 February 23, 1993 Greene
5525799 June 11, 1996 Andresen et al.
6351983 March 5, 2002 Haas et al.
20110088490 April 21, 2011 Ludwick
Foreign Patent Documents
WO 2011/052863 May 2011 WO
Other references
  • Inficon, “HAPSITE ER”, Product Brochure 2009, 4 pages.
  • PerkinElmer, “Torion T-9”, Product Brochure 2015-2016, 8 pages.
Patent History
Patent number: D834433
Type: Grant
Filed: Jun 13, 2017
Date of Patent: Nov 27, 2018
Assignee: FLIR Detection, Inc. (Stillwater, OK)
Inventors: Philip Tackett (Lafayette, IN), Kyle Buzzard (Lombard, IL), Timothy Zarki (San Francisco, CA)
Primary Examiner: Antoine D Davis
Application Number: 29/607,474
Classifications
Current U.S. Class: Chemical (12) (D10/81)