Confocal microscope

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Description

FIG. 1 is a perspective view looking downwardly at the left side of a confocal microscope in accordance with our design;

FIG. 2 is a left side view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a front elevation view thereof;

FIG. 5 is a rear elevation view thereof;

FIG. 6 is a top view thereof;

FIG. 7 is a bottom view thereof;

FIG. 8 is a perspective view looking at the right side thereof in which the imaging head of the confocal microscope is shown tilted from its position shown in FIGS. 1-6; and,

FIG. 9 is a perspective view looking at the rear elevation thereof in which the imaging head of the confocal microscope is also shown tilted from its position shown in FIGS. 1-6.

Claims

The ornamental design for a confocal microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
6137628 October 24, 2000 Kraft et al.
D492997 July 13, 2004 Distasio
D523883 June 27, 2006 Distasio et al.
7564625 July 21, 2009 McLeod et al.
D771169 November 8, 2016 Weber
D784433 April 18, 2017 Weber
D812665 March 13, 2018 Klein
20050213201 September 29, 2005 Zimmermann et al.
20120162602 June 28, 2012 Huening et al.
Other references
  • Scanning Stages with Integrated Measuring System, Märzhäuser Wetzlar GmbH Co. KG, http://www.marzhauser.com/en/products/microscope-stages/motorized-microscope-stages/scanplus-series.html, Sep. 7, 2015.
  • VivaScope(R) 1500/3000, MAVIG GmbH, 2011.
  • Stereo Microscope Boom Stands, Catalog #BS-3, Diagnostic Instruments, Inc., at least as early as Sep. 25, 2015.
  • Dual Linear Ball Bearing Arm, Old School Industries, Inc., www.osi-incorp.com, printed Sep. 25, 2015.
Patent History
Patent number: D859486
Type: Grant
Filed: Sep 27, 2015
Date of Patent: Sep 10, 2019
Assignee: CALIBER IMAGING & DIAGNOSTICS, INC. (Rochester, NY)
Inventors: Allison L. Cramb (Rochester, NY), Christopher C. Distasio (Rochester, NY), William J. Fox (Rochester, NY), Benny Alexander (Lakeway, TX), Steven Ridge (Glen Ellyn, IL), Anthony J. Roberto (Henrico, VA), Tyler W. Porter (Honeoye Falls, NY)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/540,725
Classifications
Current U.S. Class: Microscope (D16/131)