Projector
Latest FUJIFILM Corporation Patents:
- LIQUID CRYSTAL DIFFRACTION ELEMENT AND OPTICAL DEVICE
- IMAGING SUPPORT DEVICE, PERSONAL IDENTIFICATION METHOD, PROGRAM, AND MEDICAL IMAGE CAPTURING SYSTEM
- DIAGNOSTIC APPARATUS, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND PROGRAM
- LENS DEVICE AND IMAGING APPARATUS
- PHOTOSENSITIVE RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
Description
The broken lines illustrate portions of the projector and form no part of the claimed design.
Claims
The ornamental design for a projector, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
| D113515 | February 1939 | Kurtz et al. |
| D212309 | September 1968 | Ralke |
| D300535 | April 4, 1989 | Sable |
| D352304 | November 8, 1994 | Zavracky |
| D353390 | December 13, 1994 | Zavracky |
| D371564 | July 9, 1996 | Sunada |
| D421269 | February 29, 2000 | Murakami |
| 6604831 | August 12, 2003 | Prestigomo |
| D569408 | May 20, 2008 | Solomon |
| 7670012 | March 2, 2010 | Solomon |
| 7901084 | March 8, 2011 | Willey |
| 20070195294 | August 23, 2007 | Willey |
| 1613726 | November 2018 | JP |
| 1618899 | November 2018 | JP |
| 1635607 | July 2019 | JP |
| 1635608 | July 2019 | JP |
| 1635611 | July 2019 | JP |
| 1635612 | July 2019 | JP |
- An Office Action mailed by the Japanese Patent Office dated Jul. 17, 2019, which corresponds to Japanese Design Application No. 2018-015516 and is related to Design U.S. Appl. No. 29/674,137; with English language translation.
Patent History
Patent number: D877795
Type: Grant
Filed: Dec 19, 2018
Date of Patent: Mar 10, 2020
Assignee: FUJIFILM Corporation (Tokyo)
Inventors: Kunihiko Tanaka (Saitama), Koji Yoshida (Saitama)
Primary Examiner: Wan Laymon
Application Number: 29/674,137
Type: Grant
Filed: Dec 19, 2018
Date of Patent: Mar 10, 2020
Assignee: FUJIFILM Corporation (Tokyo)
Inventors: Kunihiko Tanaka (Saitama), Koji Yoshida (Saitama)
Primary Examiner: Wan Laymon
Application Number: 29/674,137
Classifications
Current U.S. Class:
Element Or Attachment (D16/235)