Low profile probe handle
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The broken lines shown in the drawings are for the purpose of illustrating environmental structure and portions of the low profile probe handle that form no part of the claimed design.
Claims
The ornamental design for a low profile probe handle, as shown and described.
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Type: Grant
Filed: Dec 21, 2018
Date of Patent: May 12, 2020
Assignee: Avent, Inc. (Alpharetta, GA)
Inventor: Ruoya Wang (Decatur, GA)
Primary Examiner: Rosemary K Tarcza
Assistant Examiner: Yolanda Robinson
Application Number: 29/674,439