Low profile probe handle

- Avent, Inc.
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Description

FIG. 1 is a front perspective view of a low profile probe handle according to the present design;

FIG. 2 is a rear perspective view of the low profile probe handle of FIG. 1;

FIG. 3 is a front view of the low profile probe handle of FIG. 1;

FIG. 4 is a right side view of the low profile probe handle of FIG. 1;

FIG. 5 is a rear view of the low profile probe handle of FIG. 1;

FIG. 6 is a left side view of the low profile probe handle of FIG. 1;

FIG. 7 is a top view of the low profile probe handle of FIG. 1;

FIG. 8 is a bottom view of the low profile probe handle of FIG. 1; and,

FIG. 9 is a right side view of the low profile probe handle of FIG. 1, shown in an environment of use.

The broken lines shown in the drawings are for the purpose of illustrating environmental structure and portions of the low profile probe handle that form no part of the claimed design.

Claims

The ornamental design for a low profile probe handle, as shown and described.

Referenced Cited
U.S. Patent Documents
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D481127 October 21, 2003 Hayamizu
D631154 January 18, 2011 Hamilton, Jr.
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D798449 September 26, 2017 Canady
D827131 August 28, 2018 Hayamizu
D843575 March 19, 2019 Hulford
D843596 March 19, 2019 Bonutti
D846117 April 16, 2019 Lesch
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Patent History
Patent number: D884166
Type: Grant
Filed: Dec 21, 2018
Date of Patent: May 12, 2020
Assignee: Avent, Inc. (Alpharetta, GA)
Inventor: Ruoya Wang (Decatur, GA)
Primary Examiner: Rosemary K Tarcza
Assistant Examiner: Yolanda Robinson
Application Number: 29/674,439
Classifications